A Review of Recent Response-Item Analyses in Educational Testing

Author(s):

Lee, Yi-Hsuan; Chen, Haiwen (Henry)

Publication Year:

2011

Source:

Psychological Test and Assessment Modeling, v53 n3 p359-379, 2011

Document Type:

Article

Page Count:

21

Subject/Key Words:

Item Response Time, Time-Limit Testing, High Stakes Testing, Low Stakes Testing